抄録
A simple technique for estimating 'morphological' distribution of charge trapping sites in semicrystalline polymers are proposed. This technique is a combination of organic solvent vapor induced charge decay and the thermally stimulated current techniques and based on the fact that solvent molecules can penetrate only in amorphous parts of semicrystalline polymers. Applying this technique to poly-4-methylpenten-1 and polypropylene, we can correlate the charge trapping sites for a given TSC band with the higher order structure of these polymers.
| 本文言語 | English |
|---|---|
| ページ | 235-240 |
| ページ数 | 6 |
| 出版ステータス | Published - 1996 12月 1 |
| イベント | Proceedings of the 1996 IEEE 9th International Symposium on Electrets, ISE 9 - Shanghai, China 継続期間: 1996 9月 25 → 1996 9月 27 |
Other
| Other | Proceedings of the 1996 IEEE 9th International Symposium on Electrets, ISE 9 |
|---|---|
| City | Shanghai, China |
| Period | 96/9/25 → 96/9/27 |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 凝縮系物理学
- 電子工学および電気工学
- 材料化学