Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe

Toshiharu Saiki

doi:10.1109/QELS.2001.961882

Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe

研究成果: Conference contribution

抄録

Summary form only given. Polarization-sensitive imaging using near-field scanning optical microscopy (NSOM) is a fundamental method for the magneto-optical study of micro-structures. The polarization NSOM also offers another contrast mechanism based on the depolarization effect due to the near-field tip-sample interaction. For achievement of higher resolution and application to opaque materials, internal-reflection NSOM (IR-NSOM) with an aperture probe is the most promising technique. Here, we demonstrate the operation of IR-NSOM through the investigation of phase-change recording media. By obtaining background suppression as high as 10^-5, amorphous marks are clearly imaged with an optical contrast higher than that in conventional far-field configuration.

本文言語	English
ホスト出版物のタイトル	Technical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	80
ページ数	1
ISBN（印刷版）	155752663X, 9781557526632
DOI	https://doi.org/10.1109/QELS.2001.961882
出版ステータス	Published - 2001
外部発表	はい
イベント	Quantum Electronics and Laser Science Conference, QELS 2001 - Baltimore, United States 継続期間: 2001 5 6 → 2001 5 11

Other

Other	Quantum Electronics and Laser Science Conference, QELS 2001
Country	United States
City	Baltimore
Period	01/5/6 → 01/5/11

ASJC Scopus subject areas

Electrical and Electronic Engineering
Radiation

文献へのアクセス

10.1109/QELS.2001.961882

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引用スタイル

Saiki, T 2001, Near-field optical polarization microscopy in internal-reflection configuration with ultrasmall aperture probe. in Technical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001., 961882, Institute of Electrical and Electronics Engineers Inc., pp. 80, Quantum Electronics and Laser Science Conference, QELS 2001, Baltimore, United States, 01/5/6. https://doi.org/10.1109/QELS.2001.961882

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