Protection is the key: Improved resolution imaging is demonstrated with the title technique, in which a bent probe is surrounded by a 100-nm protective layer to prevent direct contact between the electrode and the sample. Submicrometer structures and characteristic chemical sites can be imaged in three different modes, as demonstrated for neurites of PC12 cells (see picture). (Figure Presented).
ASJC Scopus subject areas
- 化学 (全般)