Numerical analysis of the temperature dependence of near-field polarization for nanoscale thermometry using a triple-tapered near-field optical fiber probe

J. Nitta, Y. Taguchi, T. Saiki, Y. Nagasaka

研究成果: Article査読

抄録

A novel nanoscale temperature measurement method using near-field polarization, namely polarized near-field optics thermal nanoscopy (P-NOTN), has been developed. This method is performed in illumination-collection mode (I-C mode) using an Au-coated near-field fiber probe, and enables non-contact and nanoscale temperature measurement. The polarization change of the near-field light due to temperature change in the I-C mode is complicated. In order to confirm and understand the temperature dependence of the near-field polarization, and assess the validity of the temperature measurement by P-NOTN, numerical investigations were performed by the finite-difference time-domain (FDTD) method, which numerically solves Maxwell's equations. Three-dimensional models of the Au-coated near-field fiber probe and the one-dimensional nanostructure as a sample (i.e. Au nanorod) were produced. The electromagnetic field between the probe tip and the nanoscale sample was calculated by the FDTD method in order to evaluate the polarization change in the I-C mode. The calculation results showed that the polarization plane in the near field changes as a function of the refractive index of the sample, which in turn is temperature-dependent. These calculation results verified the capability of P-NOTN to achieve nanoscale temperature measurement by detecting the temperature-dependent polarization rotation change in the near field.

本文言語English
論文番号035001
ジャーナルJournal of Optics (United Kingdom)
16
3
DOI
出版ステータスPublished - 2014 3

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学

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