TY - JOUR
T1 - Observation of amorphous recording marks using reflection-mode near-field scanning optical microscope supported by optical interference method
AU - Sakai, Masaru
AU - Mononobe, Shuji
AU - Yusu, Keiichiro
AU - Tadokoro, Toshiyasu
AU - Saiki, Toshiharu
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2005/9/8
Y1 - 2005/9/8
N2 - A signal enhancing technique for a reflection-mode near-field scanning optical microscope (NSOM) is proposed. Optical interference between the signal light, from an aperture at the tip of a tapered optical fiber, and the reflected light, from a metallic coating around the aperture, enhances the signal intensity. We used a rewritable high-definition digital versatile disc (HD DVD) with dual recording layers as a sample medium, and demonstrated observation of amorphous recording marks on the semitransparent (the first) recording layer. In spite of low optical contrast between the crystal region and the amorphous region on this layer, we successfully observed recording marks with good contrast.
AB - A signal enhancing technique for a reflection-mode near-field scanning optical microscope (NSOM) is proposed. Optical interference between the signal light, from an aperture at the tip of a tapered optical fiber, and the reflected light, from a metallic coating around the aperture, enhances the signal intensity. We used a rewritable high-definition digital versatile disc (HD DVD) with dual recording layers as a sample medium, and demonstrated observation of amorphous recording marks on the semitransparent (the first) recording layer. In spite of low optical contrast between the crystal region and the amorphous region on this layer, we successfully observed recording marks with good contrast.
KW - Aperture probe
KW - High contrast
KW - High resolution
KW - Illumination-collection mode
KW - Near-field scanning optical microscope
KW - Optical interference
KW - Recording mark
KW - Rewritable HD DVD
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U2 - 10.1143/JJAP.44.6855
DO - 10.1143/JJAP.44.6855
M3 - Article
AN - SCOPUS:31544457882
VL - 44
SP - 6855
EP - 6858
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 9 A
ER -