Optimal binning strategies under squared error loss in selective assembly with a tolerance constraint

Shun Matsuura, Nobuo Shinozaki

研究成果: Article査読

15 被引用数 (Scopus)

抄録

Selective assembly is an effective approach for improving the quality of a product assembled from two types of components when the quality characteristic is the clearance between the mating components. In this article, optimal binning strategies under squared error loss in selective assembly when the clearance is constrained by a tolerance parameter are discussed. Conditions for a set of constrained optimal partition limits are given, and uniqueness of this set is shown for the case when the dimensional distributions of the two components are identical and strongly unimodal. Some numerical results are reported that compare constrained optimal partitioning, unconstrained optimal partitioning, and equal width partitioning.

本文言語English
ページ(範囲)592-605
ページ数14
ジャーナルCommunications in Statistics - Theory and Methods
39
4
DOI
出版ステータスPublished - 2010 1

ASJC Scopus subject areas

  • 統計学および確率

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