TY - GEN
T1 - Performance improvements of on-chip solar cell for microsystem
AU - Zenibayashi, Daigo
AU - Sugiura, Takaya
AU - Nakano, Nobuhiko
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - Developing a microsystem that carries out a series of systems from acquisition of information to transmission to the outside on one chip. In this paper, we choose the solar cell as a power source of the system and the element functioning as the sensor part, and aim for improvement of function by using 0.18 μm standard CMOS process. Increasing the boundary area between the P-substrate and the N-Well which acts as a solar cell using a structure in which holes are opened in the N-Well as well as the bottom area of the N-Well. The area occupied by the solar cell was fixed at 100 μm × 100 μm, and the length of one side of the hole was varied between 1.40 and 5.44 μm. As a result, the maximum power generation efficiency was improved when the length of one side was 1.4 μm, and the value of the short circuit current increased by about 1% as compared with plain structure without hole. Also, no-dummy metal area(aperture) dependence was observed. When the no-dummy area increased the short circuit current has not proportional to the occupied area. However, regarding the open circuit voltage, superiority effect is observed.
AB - Developing a microsystem that carries out a series of systems from acquisition of information to transmission to the outside on one chip. In this paper, we choose the solar cell as a power source of the system and the element functioning as the sensor part, and aim for improvement of function by using 0.18 μm standard CMOS process. Increasing the boundary area between the P-substrate and the N-Well which acts as a solar cell using a structure in which holes are opened in the N-Well as well as the bottom area of the N-Well. The area occupied by the solar cell was fixed at 100 μm × 100 μm, and the length of one side of the hole was varied between 1.40 and 5.44 μm. As a result, the maximum power generation efficiency was improved when the length of one side was 1.4 μm, and the value of the short circuit current increased by about 1% as compared with plain structure without hole. Also, no-dummy metal area(aperture) dependence was observed. When the no-dummy area increased the short circuit current has not proportional to the occupied area. However, regarding the open circuit voltage, superiority effect is observed.
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U2 - 10.1109/ISESD.2017.8253349
DO - 10.1109/ISESD.2017.8253349
M3 - Conference contribution
AN - SCOPUS:85047554596
T3 - 2017 International Symposium on Electronics and Smart Devices, ISESD 2017
SP - 282
EP - 286
BT - 2017 International Symposium on Electronics and Smart Devices, ISESD 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Symposium on Electronics and Smart Devices, ISESD 2017
Y2 - 17 October 2017 through 19 October 2017
ER -