Phase retrieval of diffraction patterns

研究成果: Chapter

抄録

In the phase retrieval (PR) calculations of experimentally obtained diffraction patterns, it is not easy to find the correct electron density maps due to the lack of diffraction patterns around the zero-scattering angle and the Poisson noise in detecting the X-ray photons. In this chapter, we present some approaches to obtain the correct electron density maps from experimental diffraction patterns. The first is the multivariate analysis of a large number of PR maps. The second is the introduction of a similarity score to extract the correct electron density maps. The third is the dark-field PR method applied to diffraction patterns with missing small-angle regions. The algorithms presented would be helpful in solving the phase problem in the structural analyses of non-crystalline particles.

本文言語English
ホスト出版物のタイトルSpringer Series in Optical Sciences
出版社Springer Verlag
ページ141-159
ページ数19
DOI
出版ステータスPublished - 2018

出版物シリーズ

名前Springer Series in Optical Sciences
210
ISSN(印刷版)0342-4111
ISSN(電子版)1556-1534

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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