A hybrid structure of single-crystal silicon (Si) and high-density polyethylene (HDPE) was developed as a new substrate for infrared lenses by using precision press molding. A thin HDPE film was used to laminate a silicon wafer and their interface was directly bonded by the silane cross-link. The HDPE film is easy to be hot-embossed to form three-dimensional surface microstructures and the silicon wafer provides a high stiffness for the hybrid substrate. The infrared (IR) optical properties of the hybrid substrate were examined by two kinds of measurements, transmittance and image sharpness. Interestingly, the transmittance measurement result shows that the IR transmittance of the hybrid substrate is higher than that of Si itself in some region of wavelength. The imaging test result shows that the hybrid substrate is capable to produce similar image quality as Si itself. These results strongly demonstrate that the developed Si-HDPE hybrid substrate is a promising alternative substrate material for IR lens.
|出版ステータス||Published - 2016 1月|
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