Probing buried organic-organic and metal-organic heterointerfaces by hard x-ray photoelectron spectroscopy

Masahiro Shibuta, Toyoaki Eguchi, Yoshio Watanabe, Jin Young Son, Hiroshi Oji, Atsushi Nakajima

研究成果: Article

4 引用 (Scopus)

抜粋

We present a nondestructive characterization method for buried hetero-interfaces for organic/organic and metal/organic systems using hard x-ray photoelectron spectroscopy (HAXPES) which can probe electronic states at depths deeper than ∼10 nm. A significant interface-derived signal showing a strong chemical interaction is observed for Au deposited onto a C60 film, while there is no such additional feature for copper phthalocyanine deposited onto a C60 film reflecting the weak interaction between the molecules in the latter case. A depth analysis with HAXPES reveals that a Au-C 60 intermixed layer with a thickness of 5.1 nm is formed at the interface.

元の言語English
記事番号221603
ジャーナルApplied Physics Letters
101
発行部数22
DOI
出版物ステータスPublished - 2012 11 26

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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