Processing of diffraction patterns obtained from X-ray diffraction imaging experiments using X-ray free electron laser pulses

研究成果: Chapter

抄録

In X-ray diffraction imaging (XDI) experiments using X-ray free electron laser (XEFL), X-ray pulses provided at a repetition rate of more than 30 Hz enable us the collection of a large number of diffraction patterns within a short period of time. Diffraction patterns with good signal-to-noise ratios are stochastically obtained depending on the positional coincidence of the XFEL pulses and particles dispersed onto membranes. Because of the large number of diffraction patterns exceeding 31,000 per hour, automatic processing is necessary to efficiently extract those patterns worth analyzing, for instance, through selection regarding signal-to-noise ratio and merging patterns simultaneously recorded by two detectors. Here, a software suite for XFEL-XDI experiments is introduced. The algorithms and the procedures will be helpful for developing data processing software for automatically treating a large amount of two-dimensional data.

本文言語English
ホスト出版物のタイトルSpringer Series in Optical Sciences
出版社Springer Verlag
ページ125-140
ページ数16
DOI
出版ステータスPublished - 2018 1 1

出版物シリーズ

名前Springer Series in Optical Sciences
210
ISSN(印刷版)0342-4111
ISSN(電子版)1556-1534

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料

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