Properties of CuInSe2 epitaxial films grown on Pseudo lattice-matched substrates grown by molecular beam epitaxy

S. Niki, P. J. Fons, A. Yamada, T. Kurafuji, Wengang Bi, Y. Makita, Charles W. Tu

研究成果: Article査読

抄録

CuInSe2(CIS) films have been grown by molecular beam epitaxy on pseudo lattice-matched substrates which consist of a 1μm-thick In0.29Ga0.71 As layer grown on (001)-oriented GaAs substrates interposed with a linearly composition-graded In xGa1-xAs buffer (0≤x≤0.29), and have been characterized in comparison with the films grown directly on GaAs (001). High resolution X-ray diffraction analysis on CIS grown on pseudo lattice-matched substrates indicated the reduction of residual strain in the CIS films. Sharp free exciton emissions have been predominantly observed for the first time from the CIS films indicative of significant improvement in crystalline quality and of reduction of point defects. It also suggests that the misfit strain plays an important role in the formation of point defects in CIS epitaxial films.

本文言語English
ページ(範囲)X3-152
ジャーナルDenshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory
60
3
出版ステータスPublished - 1996 12 1
外部発表はい

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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