Quantification of pain degree using EEG with simple device

Junichiro Kagita, Yasue Mitsukura

研究成果: Conference contribution

抄録

The final aim of this paper is to quantify pain degree by only using Electroencephalogram (EEG) measured with simple device. Pain degree dominates the choice and assessment of a treatment in clinical care. It is conventionally quantified using pain rating scales, although they are not capable of attaining objective values. Therefore, a method which can quantify pain degree objectively has great importance. In this paper, the possibility of quantifying pain degree by only using EEG measured with simple device is proposed. The proposed method is in an easy manner considering its time consummation and procedures. Significant difference in EEG features between pain-free, painful, and psychologically painful state were confirmed as the results of the experiment, showing the possibility of attaining objective pain degree by using EEG measured with simple device.

本文言語English
ホスト出版物のタイトルProceedings - 2018 IEEE International Conference on Industrial Technology, ICIT 2018
出版社Institute of Electrical and Electronics Engineers Inc.
ページ2014-2017
ページ数4
2018-February
ISBN(電子版)9781509059492
DOI
出版ステータスPublished - 2018 4 27
イベント19th IEEE International Conference on Industrial Technology, ICIT 2018 - Lyon, France
継続期間: 2018 2 192018 2 22

Other

Other19th IEEE International Conference on Industrial Technology, ICIT 2018
CountryFrance
CityLyon
Period18/2/1918/2/22

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering

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