Quantitative evaluation of patterned self-assembled monolayers by color imaging of zeta-potential obtained from two-color fluorescence and evanescent wave illumination

研究成果: Paper査読

1 被引用数 (Scopus)

抄録

A direct evaluation technique by color imaging of the zeta-potential for a substrate surface with material heterogeneity, sample adhesion and patterns of chemical coating and self-assembled monolayers (SAMs) was developed. This technique employed two-color fluorescence excited by the evanescent wave for the zeta-potential measurement. The experiments were conducted to evaluate the monolayers of octadecyltrichrolosilane patterned on the glass surface. The color mapping of wall zetapotential of SAMs patterned on the microchannel wall was achieved, which has not been realized by the conventional techniques focusing on thickness and structure of molecules and wettability.

本文言語English
ページ643-645
ページ数3
出版ステータスPublished - 2008
イベント12th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2008 - San Diego, CA, United States
継続期間: 2008 10 122008 10 16

Other

Other12th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2008
国/地域United States
CitySan Diego, CA
Period08/10/1208/10/16

ASJC Scopus subject areas

  • 化学工学(その他)
  • バイオエンジニアリング

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