Raman investigation of the localized vibrational mode of carbon in strain-relaxed Si1-xGex:C

Ken Morita, Kohei M. Itoh, Lone Hoffmann, Brian B. Nielsen, Hiroshi Harima, Kohji Mizoguchi

研究成果: Article査読

1 被引用数 (Scopus)

抄録

The localized vibrational mode (LVM) of carbon in strain-relaxed Si1-xGex:C samples with x = 0, 0.05, 0.35, and 0.5 have been investigated by Raman spectroscopy at room- and liquid-nitrogen-temperatures. The position of the Raman peaks due to LVM of carbon shifts linearly to lower frequencies with increasing x from 0 to 0.5. The LVM frequencies of carbon obtained by Raman measurement agree very well with those determined by Hoffmann et al. in infrared (IR) absorption recently.

本文言語English
ページ(範囲)5905-5906
ページ数2
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
40
10
DOI
出版ステータスPublished - 2001 10

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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