Recent advances in near-field optical microscopy

研究成果: Conference contribution

抄録

Summary form only given. Current progress in the instrumentation and measurements of NSOM is described. The most critical element in NSOM is an aperture probe, which is a tapered and metal-coated optical fiber. The design and fabrication of the probe are examined with regard to aperture quality and the efficiency of light propagation. The recent dramatic improvements in spatial resolution and optical throughput are illustrated by selected applications, Raman spectroscopy, polarization microscopy, and the emission imaging of semiconductor nanostructures and single molecules. Real-space mapping of exciton wavefunctions confined in a quantum dot is also demonstrated as an application of NSOM to wavefunction engineering.

本文言語English
ホスト出版物のタイトル2002 International Microprocesses and Nanotechnology Conference, MNC 2002
出版社Institute of Electrical and Electronics Engineers Inc.
ページ6-7
ページ数2
ISBN(電子版)4891140313, 9784891140311
DOI
出版ステータスPublished - 2002
イベントInternational Microprocesses and Nanotechnology Conference, MNC 2002 - Tokyo, Japan
継続期間: 2002 11 62002 11 8

出版物シリーズ

名前2002 International Microprocesses and Nanotechnology Conference, MNC 2002

Other

OtherInternational Microprocesses and Nanotechnology Conference, MNC 2002
国/地域Japan
CityTokyo
Period02/11/602/11/8

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学

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