Reflectometry based on two-photon absorption of a silicon avalanche photodiode

Y. Tanaka, P. G. Chua, T. Kurokawa, H. Tsuda, M. Naganuma, M. Takeda

    研究成果: Conference contribution

    2 被引用数 (Scopus)

    抄録

    Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.

    本文言語English
    ホスト出版物のタイトル2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
    出版社Institute of Electrical and Electronics Engineers Inc.
    ページ577-580
    ページ数4
    ISBN(電子版)0780372891, 9780780372894
    DOI
    出版ステータスPublished - 2002 1 1
    イベント15th Optical Fiber Sensors Conference Technical Digest, OFS 2002 - Portland, United States
    継続期間: 2002 5 62002 5 10

    出版物シリーズ

    名前2002 15th Optical Fiber Sensors Conference Technical Digest, OFS 2002

    Other

    Other15th Optical Fiber Sensors Conference Technical Digest, OFS 2002
    CountryUnited States
    CityPortland
    Period02/5/602/5/10

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Electrical and Electronic Engineering

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