Resonant escape over an oscillating barrier in a single-electron ratchet transfer

Satoru Miyamoto, Katsuhiko Nishiguchi, Yukinori Ono, Kohei M. Itoh, Akira Fujiwara

研究成果: Article

20 引用 (Scopus)

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Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time-scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.

元の言語English
記事番号033303
ジャーナルPhysical Review B - Condensed Matter and Materials Physics
82
発行部数3
DOI
出版物ステータスPublished - 2010 7 22

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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