Scanning electron microscopy of negatively stained catalase on a silicon wafer

Taiji Furuno, Kevin M. Ulmer, Hiroyuki Sasabe

研究成果: Article査読

7 被引用数 (Scopus)

抄録

A highresolution scanning electron microscope capable of 7spatial resolution at 30kV accelerating voltage was used to observe negatively stained protein molecules. Thin platelet crystals, densely packed monolayers, and lowdensity deposits of beef liver catalase were prepared on the surface of silicon wafers and negatively stained with phosphotungstic acid. The tetrameric structure of the catalase molecule was observed for the first time by scanning electron microscopy on the surface of the smooth silicon wafer. Copyright1992 WileyLiss, Inc.

本文言語English
ページ(範囲)32-38
ページ数7
ジャーナルMicroscopy Research and Technique
21
1
DOI
出版ステータスPublished - 1992 3月 1
外部発表はい

ASJC Scopus subject areas

  • 解剖学
  • 組織学
  • 器械工学
  • 医療検査技術

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