Semi-Supervised learning for electron microscopy image segmentation

Eichi Takaya, Yusuke Takeichi, Mamiko Ozaki, Satoshi Kurihara

研究成果: Conference contribution

本文言語English
ホスト出版物のタイトル33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019
出版社AAAI press
ページ10047-10048
ページ数2
ISBN(電子版)9781577358091
出版ステータスPublished - 2019
イベント33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019 - Honolulu, United States
継続期間: 2019 1 272019 2 1

出版物シリーズ

名前33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019

Conference

Conference33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019
国/地域United States
CityHonolulu
Period19/1/2719/2/1

ASJC Scopus subject areas

  • 人工知能

引用スタイル