Simplified static analysis for shock behavior evaluation of thin glass plates

Seong In Moon, Chang Hoi Kim, J. C. Koo, Jae Boong Choi, Young Jin Kim, Yun Jae Kim

研究成果: Conference contribution

抄録

Recently, mechanical shock failures of a flat display unit such as TFT-LCD device have been an important concern of designers. In order to achieve the mechanical shock requirement, it is necessary to perform the detailed FE analyses which could be very expensive either by the lengthy computation or by the complicated geometry modeling. The objective of this study is to propose a simplified analysis methodology to simulate impact behavior of thin glass plates. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress under impact loading. To show the plausibility of the proposed approach, it is applied to the idealized problem which is a two dimensional beam subjected to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, it was shown that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Therefore, the proposed approach provides significant advantages in design optimization of a TFT-LCD device against shock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened.

本文言語English
ホスト出版物のタイトルAdvances in Safety and Structural Integrity 2005 - Proceedings of the International Symposium on Safety and Structural Integrity
出版社Trans Tech Publications Ltd
ページ263-270
ページ数8
ISBN(印刷版)3908451159, 9783908451150
DOI
出版ステータスPublished - 2006
イベントInternational Symposium on Safety and Structural Integrity - Singapore, Singapore
継続期間: 2005 1 172005 1 20

出版物シリーズ

名前Solid State Phenomena
110
ISSN(印刷版)1012-0394

Conference

ConferenceInternational Symposium on Safety and Structural Integrity
CountrySingapore
CitySingapore
Period05/1/1705/1/20

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

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