TY - JOUR
T1 - Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications
AU - Uchida, Ken
AU - Tanamoto, Tetsufumi
AU - Ohba, Ryuji
AU - Yasuda, Shin Ichi
AU - Fujita, Shinobu
N1 - Funding Information:
This research was partly supported by NICT. The authors would like to thank J. Koga and H. Nozaki for valuable discussion and Dr. N. Fukushima, Dr. A Kurobe, and Dr. S. Watanabe for support throughout this work.
PY - 2002
Y1 - 2002
N2 - We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.
AB - We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.
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M3 - Conference article
AN - SCOPUS:0036923357
SP - 177
EP - 180
JO - Technical Digest - International Electron Devices Meeting
JF - Technical Digest - International Electron Devices Meeting
SN - 0163-1918
T2 - 2002 IEEE International Devices Meeting (IEDM)
Y2 - 8 December 2002 through 11 December 2002
ER -