Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications

Ken Uchida; Tetsufumi Tanamoto; Ryuji Ohba; Shin Ichi Yasuda; Shinobu Fujita

Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications

Ken Uchida, Tetsufumi Tanamoto, Ryuji Ohba, Shin Ichi Yasuda, Shinobu Fujita

研究成果: Conference article › 査読

抄録

We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.

本文言語	English
ページ（範囲）	177-180
ページ数	4
ジャーナル	Technical Digest - International Electron Devices Meeting
出版ステータス	Published - 2002 12 1
イベント	2002 IEEE International Devices Meeting (IEDM) - San Francisco, CA, United States 継続期間: 2002 12 8 → 2002 12 11

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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引用スタイル

@article{1b80b7df9b4a40d78a99e43488d86992,

title = "Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications",

abstract = "We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.",

author = "Ken Uchida and Tetsufumi Tanamoto and Ryuji Ohba and Yasuda, {Shin Ichi} and Shinobu Fujita",

year = "2002",

month = dec,

day = "1",

language = "English",

pages = "177--180",

journal = "Technical Digest - International Electron Devices Meeting",

issn = "0163-1918",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2002 IEEE International Devices Meeting (IEDM) ; Conference date: 08-12-2002 Through 11-12-2002",

}

TY - JOUR

T1 - Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications

AU - Uchida, Ken

AU - Tanamoto, Tetsufumi

AU - Ohba, Ryuji

AU - Yasuda, Shin Ichi

AU - Fujita, Shinobu

PY - 2002/12/1

Y1 - 2002/12/1

N2 - We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.

AB - We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.

UR - http://www.scopus.com/inward/record.url?scp=0036923357&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036923357&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036923357

SP - 177

EP - 180

JO - Technical Digest - International Electron Devices Meeting

JF - Technical Digest - International Electron Devices Meeting

SN - 0163-1918

T2 - 2002 IEEE International Devices Meeting (IEDM)

Y2 - 8 December 2002 through 11 December 2002

ER -