Spatial distribution of the charged particles and potentials during beam extraction in a negative-ion source

K. Tsumori, H. Nakano, M. Kisaki, K. Ikeda, K. Nagaoka, M. Osakabe, Y. Takeiri, O. Kaneko, M. Shibuya, E. Asano, T. Kondo, M. Sato, S. Komada, H. Sekiguchi, N. Kameyama, T. Fukuyama, S. Wada, A. Hatayama

研究成果: Article

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We report on the characteristics of the electronegative plasma in a large-scale hydrogen negative ion (H-) source. The measurement has been made with a time-resolved Langmuir probe installed in the beam extraction region. The H- density is monitored with a cavity ring-down system to identify the electrons in the negative charges. The electron-saturation current decreases rapidly after starting to seed Cs, and ion-ion plasma is observed in the extraction region. The H- density steps down during the beam extraction and the electron density jumps up correspondingly. The time integral of the decreasing H- charge density agrees well with the electron charge collected with the probe. The agreement of the charges is interpreted to indicate that the H- density decreasing at the beam extraction is compensated by the electrons diffusing from the driver region. In the plasmas with very low electron density, the pre-sheath of the extraction field penetrates deeply inside the plasmas. That is because the shielding length in those plasmas is longer than that in the usual electron-ion plasmas, and furthermore the electrons are suppressed to diffuse to the extraction region due to the strong magnetic field.

元の言語English
記事番号02B116
ジャーナルReview of Scientific Instruments
83
発行部数2
DOI
出版物ステータスPublished - 2012 2

ASJC Scopus subject areas

  • Instrumentation

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    Tsumori, K., Nakano, H., Kisaki, M., Ikeda, K., Nagaoka, K., Osakabe, M., Takeiri, Y., Kaneko, O., Shibuya, M., Asano, E., Kondo, T., Sato, M., Komada, S., Sekiguchi, H., Kameyama, N., Fukuyama, T., Wada, S., & Hatayama, A. (2012). Spatial distribution of the charged particles and potentials during beam extraction in a negative-ion source. Review of Scientific Instruments, 83(2), [02B116]. https://doi.org/10.1063/1.3672116