Spin seebeck effect in Ni81Fe19/Pt thin films with different widths

K. Uchida, T. Ota, K. Harii, K. Ando, K. Sasage, H. Nakayama, K. Ikeda, E. Saitoh

研究成果: Article

13 引用 (Scopus)

抜粋

The spin Seebeck effect (SSE) has been measured in Ni81Fe 19 thin films which have different widths by using the inverse spin Hall effect (ISHE) in a Pt wire. The ISHE voltage induced by SSE is enhanced by lengthening the Pt wire. Combined with ISHE, SSE is applicable to the production of electric generators in which the thermoelectric figures of merit are tunable in terms of device structure.

元の言語English
記事番号4957754
ページ(範囲)2386-2388
ページ数3
ジャーナルIEEE Transactions on Magnetics
45
発行部数6
DOI
出版物ステータスPublished - 2009 6 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

フィンガープリント Spin seebeck effect in Ni<sub>81</sub>Fe<sub>19</sub>/Pt thin films with different widths' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Uchida, K., Ota, T., Harii, K., Ando, K., Sasage, K., Nakayama, H., Ikeda, K., & Saitoh, E. (2009). Spin seebeck effect in Ni81Fe19/Pt thin films with different widths. IEEE Transactions on Magnetics, 45(6), 2386-2388. [4957754]. https://doi.org/10.1109/TMAG.2009.2018582