Study of negative ion beam emittance characteristic using 3D PIC-MCC simulation

K. Miyamoto, K. Nagaoka, A. Hatayama, K. Hoshino, H. Nakano, T. Shibata, K. Tsumori

研究成果: Conference article査読

抄録

It is reported from the measurement of a negative ion beamlet emittance that the characteristic three-Gaussian components are observed in the emittance diagram. The negative ion trajectories are calculated using 3D PIC-MCC simulation in order to clarify the origin of this complicated phase space structure and underlying physical mechanism. The characteristic three-Gaussian components can be reproduced in the emittance diagram from the simulation result. It is verified that the Gaussian components are caused by the negative ions extracted from the different plasma meniscus region, that is, the central region or the region near the edges of the meniscus.

本文言語English
論文番号012040
ジャーナルJournal of Physics: Conference Series
2244
1
DOI
出版ステータスPublished - 2022 4月 25
イベント19th International Conference on Ion Sources, ICIS 2021 - Virtual, Online
継続期間: 2021 9月 202021 9月 24

ASJC Scopus subject areas

  • 物理学および天文学(全般)

フィンガープリント

「Study of negative ion beam emittance characteristic using 3D PIC-MCC simulation」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル