Study on fatigue strength characteristics for solder joints

Daisuke Kaneko, Hirotsugu Inoue, Kikuo Kishimoto, Masaki Omiya, Masazumi Amagai

研究成果: Conference contribution

抄録

Recently, preventing environmental pollutions, Pb-free solders are about to replace Sn-Pb eutectic solders. Sn-Ag-Cu alloys are leading candidates for Pb-free solders. However, Sn-Ag-Cu alloys were not enough to meet severe board level reliability requirements. In particular, thermal fatigue failure still has the problem. The interfacial strength decreases with intermetallic compounds (IMC) formation between solders and electric pads. Because IMC is brittle, the growth of IMC strongly affects the reliability of solder joints. However, for lead-free solder joints, the effects of IMC layer development on fatigue strength have not been studied well. In this study, in order to inhibit the IMC formation, 6 kinds of nano particles of metal (Cu, Ni, Co, Pt, In, Sb) were added to the solders based on Sn-Ag. We carried out board level fatigue tests and observed and conducted elemental analysis of cross-section surface of solders. And then we considered the relation of the fatigue life of several lead free solder joints and the change of the IMC layer by thermal aging. We aged the specimens in the isothermal chamber under 150°C for 0 to 20 days. As a result of the fatigue tests, about the solder including nickel, the fatigue life after aging is longer and fatigue strength reduction after aging is more lowered than the other solders. And the results of observation showed that IMC layers grow grained and the irregularity of interface between the IMC layers and the solder layers is smaller about the solder including nickel. So we consider that that improves resistance to crack advance, and then the solder showed the higher fatigue strength.

本文言語English
ホスト出版物のタイトルEMAP 2007- International Conference on Electronic Materials and Packaging 2007
DOI
出版ステータスPublished - 2007 12月 1
イベントInternational Conference on Electronic Materials and Packaging 2007, EMAP 2007 - Daejeon, Korea, Republic of
継続期間: 2007 11月 192007 11月 22

出版物シリーズ

名前EMAP 2007 - International Conference on Electronic Materials and Packaging 2007

Other

OtherInternational Conference on Electronic Materials and Packaging 2007, EMAP 2007
国/地域Korea, Republic of
CityDaejeon
Period07/11/1907/11/22

ASJC Scopus subject areas

  • 電子工学および電気工学

フィンガープリント

「Study on fatigue strength characteristics for solder joints」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル