TY - GEN
T1 - Study on novel micro optical diffusion sensor based on laser induced dielectrophoresis
AU - Itani, Koichi
AU - Oka, Tetsuhiro
AU - Taguchi, Yoshihiro
AU - Nagasaka, Yuji
PY - 2010/6/1
Y1 - 2010/6/1
N2 - We have developed a novel micro optical diffusion sensor (MODS) based on a laser induced dielectrophoresis (LIDEP) enabling small sample volume, high-speed measurement and on-site sensing of the protein conformation. This paper reports the measurement principle, chip design and the validity of the proposed method. In order to verify the applicability of MODS, we confirmed the sinusoidal concentration distribution of polystyrene beads in distilled water generated by LIDEP force. The decay time of the diffusion of the concentration distribution agreed well with the theoretical calculation. As a result, the applicability of MODS as the diffusion coefficient measurement method was verified.
AB - We have developed a novel micro optical diffusion sensor (MODS) based on a laser induced dielectrophoresis (LIDEP) enabling small sample volume, high-speed measurement and on-site sensing of the protein conformation. This paper reports the measurement principle, chip design and the validity of the proposed method. In order to verify the applicability of MODS, we confirmed the sinusoidal concentration distribution of polystyrene beads in distilled water generated by LIDEP force. The decay time of the diffusion of the concentration distribution agreed well with the theoretical calculation. As a result, the applicability of MODS as the diffusion coefficient measurement method was verified.
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U2 - 10.1109/MEMSYS.2010.5442350
DO - 10.1109/MEMSYS.2010.5442350
M3 - Conference contribution
AN - SCOPUS:77952770783
SN - 9781424457649
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 891
EP - 894
BT - MEMS 2010 - The 23rd IEEE International Conference on Micro Electro Mechanical Systems, Technical Digest
T2 - 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
Y2 - 24 January 2010 through 28 January 2010
ER -