TCI Tester: Tester for through Chip Interface

Hideto Kayashima, Hideharu Amano

研究成果: Conference contribution

本文言語English
ホスト出版物のタイトルProceedings of the 26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021
出版社Institute of Electrical and Electronics Engineers Inc.
ページ103-104
ページ数2
ISBN(電子版)9781450379991
DOI
出版ステータスPublished - 2021 1 18
イベント26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021 - Virtual, Online, Japan
継続期間: 2021 1 182021 1 21

出版物シリーズ

名前Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021
CountryJapan
CityVirtual, Online
Period21/1/1821/1/21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

引用スタイル