The effect of transport and extraction of non-uniform surface produced H- in large multi-aperture negative ion sources

S. Fujita, T. Yamamoto, M. Yoshida, M. Kashiwagi, A. Hatayama

研究成果: Conference contribution

抄録

In order to compare the simulation and the experiments of the extracted H- beams in JT-60SA negative ion source, an analysis of H- ion transport has been conducted. It has been shown that, under the present conditions, the calculated beam profile correlates well with the experiments, and the majority of the extracted H- ions are produced at the surface of the extraction aperture. However, since those H- ions could contribute to beam halo, a careful evaluation of the beam optics, taking into account more realistic plasma potential will be needed in the future works.

本文言語English
ホスト出版物のタイトルProceedings of the 17th International Conference on Ion Sources
編集者Edgar Mahner, Richard Scrivens, Richard Pardo, Jacques Lettry, Bruce Marsh
出版社American Institute of Physics Inc.
ISBN(印刷版)9780735417274
DOI
出版ステータスPublished - 2018 9月 21
イベント17th International Conference on Ion Sources 2018 - Geneva, Switzerland
継続期間: 2017 9月 152017 9月 20

出版物シリーズ

名前AIP Conference Proceedings
2011
ISSN(印刷版)0094-243X
ISSN(電子版)1551-7616

Other

Other17th International Conference on Ion Sources 2018
国/地域Switzerland
CityGeneva
Period17/9/1517/9/20

ASJC Scopus subject areas

  • 物理学および天文学(全般)

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