Theory of X-ray diffraction imaging

研究成果: Chapter

抄録

X-ray diffraction imaging (XDI) is a technique for visualizing the structures of non-crystalline particles with dimensions ranging from micrometers to submicrometers. In XDI experiments, non-crystalline particles are irradiated by X-rays with high transverse coherence. Then, the Fraunhofer diffraction pattern is recorded under the oversampling condition at a desired resolution. The electron density map of the particle projected along the direction of the incident X-ray is reconstructed by applying the phase-retrieval (PR) algorithm to the diffraction pattern alone. In this chapter, the spatial coherence of X-rays, the X-ray source necessary for XDI, and the representative algorithms used for PR are introduced.

本文言語English
ホスト出版物のタイトルSpringer Series in Optical Sciences
出版社Springer Verlag
ページ49-74
ページ数26
DOI
出版ステータスPublished - 2018 1 1

出版物シリーズ

名前Springer Series in Optical Sciences
210
ISSN(印刷版)0342-4111
ISSN(電子版)1556-1534

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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