Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Masashi Kuwahara, Osamu Suzuki, Naoyuki Taketoshi, Takashi Yagi, Paul Fons, Junji Tominaga, Tetsuya Baba

研究成果: Article査読

19 被引用数 (Scopus)

抄録

Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2 Te 3, SbTeo, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.

本文言語English
ページ(範囲)6863-6864
ページ数2
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
46
10 A
DOI
出版ステータスPublished - 2007 10月 9
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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