Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

H. Toda, E. Maire, Y. Aoki, M. Kobayashi

研究成果: Article査読

26 被引用数 (Scopus)

抄録

Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

本文言語English
ページ(範囲)549-561
ページ数13
ジャーナルJournal of Strain Analysis for Engineering Design
46
7
DOI
出版ステータスPublished - 2011 10

ASJC Scopus subject areas

  • Modelling and Simulation
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics

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