Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi; Yuko Inatomi; Tomohiro Tanaka; Naoto Shinozaki; Masahito Watanabe; Akira Fujimoto; Kouhei Itoh

doi:10.1143/JJAP.45.5274

Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi, Yuko Inatomi, Tomohiro Tanaka, Naoto Shinozaki, Masahito Watanabe, Akira Fujimoto, Kouhei Itoh

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研究成果: Article › 査読

5 被引用数 (Scopus)

抄録

The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope ⁷³Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

本文言語	English
ページ（範囲）	5274-5276
ページ数	3
ジャーナル	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
巻	45
号	6 A
DOI	https://doi.org/10.1143/JJAP.45.5274
出版ステータス	Published - 2006

ASJC Scopus subject areas

工学（全般）
物理学および天文学（全般）

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10.1143/JJAP.45.5274

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Onishi, F., Inatomi, Y., Tanaka, T., Shinozaki, N., Watanabe, M., Fujimoto, A., & Itoh, K. (2006). Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 45(6 A), 5274-5276. https://doi.org/10.1143/JJAP.45.5274

Onishi, F, Inatomi, Y, Tanaka, T, Shinozaki, N, Watanabe, M, Fujimoto, A & Itoh, K 2006, 'Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 45, no. 6 A, pp. 5274-5276. https://doi.org/10.1143/JJAP.45.5274

@article{94a15959112242a4b797fa359b84ef1a,

title = "Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient",

abstract = "The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.",

keywords = "Convection, Germanium, Isotope, Self-diffusion coefficient, Static magnetic field, Time-of-flight secondary mass spectrometry",

author = "Fumitomo Onishi and Yuko Inatomi and Tomohiro Tanaka and Naoto Shinozaki and Masahito Watanabe and Akira Fujimoto and Kouhei Itoh",

year = "2006",

doi = "10.1143/JJAP.45.5274",

language = "English",

volume = "45",

pages = "5274--5276",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "6 A",

}

TY - JOUR

T1 - Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

AU - Onishi, Fumitomo

AU - Inatomi, Yuko

AU - Tanaka, Tomohiro

AU - Shinozaki, Naoto

AU - Watanabe, Masahito

AU - Fujimoto, Akira

AU - Itoh, Kouhei

PY - 2006

Y1 - 2006

N2 - The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

AB - The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

KW - Convection

KW - Germanium

KW - Isotope

KW - Self-diffusion coefficient

KW - Static magnetic field

KW - Time-of-flight secondary mass spectrometry

UR - http://www.scopus.com/inward/record.url?scp=33745286798&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33745286798&partnerID=8YFLogxK

U2 - 10.1143/JJAP.45.5274

DO - 10.1143/JJAP.45.5274

M3 - Article

AN - SCOPUS:33745286798

SN - 0021-4922

VL - 45

SP - 5274

EP - 5276

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 6 A

ER -

Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

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