抄録
The microscopic liquid crystal (LC) orientation distribution in an in-plane switching (IPS) LC display device has been studied using a near-field scanning optical microscope (NSOM). The new NSOM system, which features an improved metal-coated optical fiber probe and is specifically designed for LC orientation analysis, has enabled successful visualization of the two-dimensional LC orientation distribution at the substrate surface. The observed NSOM images can be reproduced by theoretical simulations. These images together with the simulations reveal that the uneven-level structure of the interdigitated electrodes causes the asymmetric local LC orientation distribution near the electrode edges.
| 本文言語 | English |
|---|---|
| ページ（範囲） | L57-L59 |
| ジャーナル | Japanese Journal of Applied Physics, Part 2: Letters |
| 巻 | 42 |
| 号 | 1 A/B |
| DOI | |
| 出版ステータス | Published - 2003 1 15 |
ASJC Scopus subject areas
- 工学（全般）
- 物理学および天文学（その他）
- 物理学および天文学（全般）