Two-dimensional analysis of liquid crystal orientation at in-plane switching substrate surface using a near-field scanning optical microscope

Toshiyasu Tadokoro, Toshiharu Saiki, Hirokazu Toriumi

研究成果: Letter査読

11 被引用数 (Scopus)

抄録

The microscopic liquid crystal (LC) orientation distribution in an in-plane switching (IPS) LC display device has been studied using a near-field scanning optical microscope (NSOM). The new NSOM system, which features an improved metal-coated optical fiber probe and is specifically designed for LC orientation analysis, has enabled successful visualization of the two-dimensional LC orientation distribution at the substrate surface. The observed NSOM images can be reproduced by theoretical simulations. These images together with the simulations reveal that the uneven-level structure of the interdigitated electrodes causes the asymmetric local LC orientation distribution near the electrode edges.

本文言語English
ページ(範囲)L57-L59
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
42
1 A/B
DOI
出版ステータスPublished - 2003 1 15

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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