Two methods for estimating product lifetimes from only warranty claims data

Kazuyuki Suzuki, Md Mesbahul Alam, Takuji Yoshikawa, Wataru Yamamoto

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

Knowledge about product lifetime derived from real usage (field) data is of great interest in reliability analysis. A preferred source of such knowledge is warranty data, which are generated and updated at no additional cost from customer claims during warranty coverage. However, warranty databases contain only failure-related data, non-failure data is not included. This makes analysis difficult. The present research proposes two alternative methods for estimating product lifetimes from warranty claims data only. Two alternative methods, maximum likelihood and semiparametric, are described for estimating product lifetimes from warranty claims data only. They consider two lifetime variables: exponential failure, which corresponds to random failure mode, and Weibull failure, which corresponds to wear-out failure mode. They use only usage-at-failure data including exponential failure data. Simulation demons frated their applicability.

本文言語English
ホスト出版物のタイトルProceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
ページ111-119
ページ数9
DOI
出版ステータスPublished - 2008
外部発表はい
イベント2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008 - Yokohama, Japan
継続期間: 2008 7月 142008 7月 17

出版物シリーズ

名前Proceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008

Other

Other2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
国/地域Japan
CityYokohama
Period08/7/1408/7/17

ASJC Scopus subject areas

  • 制御およびシステム工学
  • 安全性、リスク、信頼性、品質管理

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