Ultrafast crystalline-to-amorphous phase transition in Ge 2Sb2Te5 chalcogenide alloy thin film using single-shot imaging spectroscopy

Jun Takeda, Wataru Oba, Yasuo Minami, Toshiharu Saiki, Ikufumi Katayama

研究成果: Article査読

41 被引用数 (Scopus)

抄録

We have observed an irreversible ultrafast crystalline-to-amorphous phase transition in Ge2Sb2Te5 chalcogenide alloy thin film using broadband single-shot imaging spectroscopy. The absorbance change that accompanied the ultrafast amorphization was measured via single-shot detection even for laser fluences above the critical value, where a permanent amorphized mark was formed. The observed rise time to reach the amorphization was found to be ∼130-200 fs, which was in good agreement with the half period of the A1 phonon frequency in the octahedral GeTe6 structure. This result strongly suggests that the ultrafast amorphization can be attributed to the rearrangement of Ge atoms from an octahedral structure to a tetrahedral structure. Finally, based on the dependence of the absorbance change on the laser fluence, the stability of the photoinduced amorphous phase is discussed.

本文言語English
論文番号261903
ジャーナルApplied Physics Letters
104
26
DOI
出版ステータスPublished - 2014

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

フィンガープリント 「Ultrafast crystalline-to-amorphous phase transition in Ge <sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> chalcogenide alloy thin film using single-shot imaging spectroscopy」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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