Unified roughness scattering model incorporating scattering component induced by thickness fluctuations in silicon-on-insulator metal-oxide- semiconductor field-effect transistors

Takamitsu Ishihara, Ken Uchida, Junji Koga, Shin Ichi Takagi

研究成果: Article査読

15 被引用数 (Scopus)

フィンガープリント

「Unified roughness scattering model incorporating scattering component induced by thickness fluctuations in silicon-on-insulator metal-oxide- semiconductor field-effect transistors」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

Physics & Astronomy

Engineering & Materials Science