抄録
We present an experimental setup to dramatically reduce a measurement time for obtaining spatial distributions of terahertz electric-field (E-field) vectors. The method utilizes the electro-optic sampling, and we use a charge-coupled device to detect a spatial distribution of the probe beam polarization rotation by the E-field-induced Pockels effect in a 〈110〉-oriented ZnTe crystal. A quick rotation of the ZnTe crystal allows analyzing the terahertz E-field direction at each image position, and the terahertz E-field vector mapping at a fixed position of an optical delay line is achieved within 21 ms. Video-rate mapping of terahertz E-field vectors is likely to be useful for achieving real-time sensing of terahertz vector beams, vector vortices, and surface topography. The method is also useful for a fast polarization analysis of terahertz beams.
本文言語 | English |
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論文番号 | 151103 |
ジャーナル | Applied Physics Letters |
巻 | 105 |
号 | 15 |
DOI | |
出版ステータス | Published - 2014 10月 13 |
ASJC Scopus subject areas
- 物理学および天文学(その他)