We present an experimental setup to dramatically reduce a measurement time for obtaining spatial distributions of terahertz electric-field (E-field) vectors. The method utilizes the electro-optic sampling, and we use a charge-coupled device to detect a spatial distribution of the probe beam polarization rotation by the E-field-induced Pockels effect in a 〈110〉-oriented ZnTe crystal. A quick rotation of the ZnTe crystal allows analyzing the terahertz E-field direction at each image position, and the terahertz E-field vector mapping at a fixed position of an optical delay line is achieved within 21 ms. Video-rate mapping of terahertz E-field vectors is likely to be useful for achieving real-time sensing of terahertz vector beams, vector vortices, and surface topography. The method is also useful for a fast polarization analysis of terahertz beams.
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