Wide-field AC magnetic field imaging using continuous-wave optically detected magnetic resonance of nitrogen-vacancy centers in diamond

Karl J. Hallbäck, Tatsuma Yamaguchi, Yuichiro Matsuzaki, Hideyuki Watanabe, Norikazu Mizuochi, Junko Ishi-Hayase

研究成果: Conference contribution

抄録

Nitrogen-vacancy (NV) center in diamond is a promising candidate for a highly-sensitive magnetometer with high spatial resolution at room temperature. Conventional magnetometry typically uses scanning confocal microscopic techniques that require long measurement times to achieve a wide observation area and/or high sensitivity. Wide-field imaging techniques using CCD/CMOS camera has the advantage of enabling a wide field of view and rapid acquisition time by simultaneously detecting signals from NV centers in a large number of pixels of the camera. Continuous-wave optically detected magnetic resonance (CW-ODMR) is suitable for wide-field imaging of magnetic field using cameras with slow response time. However, only DC or low-frequency (up to kHz) AC magnetic field can be detected using CW-ODMR techniques. Recently, our group has developed a new measurement protocol using CW-ODMR to detect high-frequency (MHz range) AC magnetic fields using the zero-field splitting of the spin triplet states of NV centers. This technique is compatible with CCD-based imaging techniques. In this study, we implement our CW-ODMR protocol and measure the spatial-distribution of high-frequency AC magnetic fields with a wide-field imaging setup. Using our home-built wide-field imaging setup, a bulk diamond sample was mounted on a microwave antenna and a target AC magnetic field was applied by a copper wire placed on the sample surface. By comparing the CW-ODMR spectra with and without applied field, it is demonstrated that the AC magnetic field can be detected and estimated according to the protocol. Detection was performed both in wide-field view and windows of few pixels while averaging the signal over many pixels enabled rapid measurements.

本文言語English
ホスト出版物のタイトルOptical and Quantum Sensing and Precision Metrology
編集者Selim M. Shahriar, Jacob Scheuer
出版社SPIE
ISBN(電子版)9781510642355
DOI
出版ステータスPublished - 2021
イベントOptical and Quantum Sensing and Precision Metrology 2021 - Virtual, Online, United States
継続期間: 2021 3 62021 3 11

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
11700
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Conference

ConferenceOptical and Quantum Sensing and Precision Metrology 2021
国/地域United States
CityVirtual, Online
Period21/3/621/3/11

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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